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> Ttc / acterna t-berd 211 T1 analyzer - jdsu
Ttc / acterna t-berd 211 T1 analyzer - jdsu
Acterna / TTC T-Berd 211 T-Carrier T1 Analyzer
Comes with 30-day warranty and a Manual.
T-Berd T-Carrier Analyzer Features:
* Automatic configuration and results summary
* Automated sequences of test patterns for one-step circuit qualification and stress tests
* Pulse shape analysis, signal level and frequency, simplex current, and wander measurements
* Out-of-band ESF loop codes standard
* Wideband and high band jitter measurement
Operating Modes: Self Test, Automatic Configuration, T1 Unframed, T1 D4 Framed, T1 ESF Framed, T1 SLC Framed. T1C Test Loopback, Auxiliary
Patterns: All Ones, 1:1, 1:7, 2 in 8, 3 in 23, QRSS (T1 and T1C), 2^15 -1, 2^20 -1, 2^23 -1, User Pattern 1 (3-24 bits), User Pattern 2 (3-24 bits), BRIDGTAP(tm) Pattern Sequence, MULTIPAT(tm) Pattern Sequence, All Zeros
Input and Output Connectors: Bantam, WECO 310, 15-pin D, BNC
Bridge: > 1000 ohms with ALBO
Bridge or term: +6 dBdsx to -35 dBdsx (T1), +3 dBdsx to -6 dBdsx (T1C)
DSX-MON: +6 dBdsx to -24 dBdsx (T1), +3 dBdsx to -24 dBdsx (T1C)
Level Measurement: +6 dBdsx to -40 dBdsx; +6 to -6, 0.1 dB resolution; -6 to -40, 0.5 dB resolution
Frequency Measurement: 1 Hz resolutions; 5 ppm accuracy
Transmit Timing Sources: Internal Clock, External Clock, Reference Clock, Recovered Clock
Loopback Codes: CSU, CSU Line (ESF), CSU Payload (ESF), NIU (FAC1, FAC2, FAC3), NIU Network (ESF), Programmable (3 to 8 bits)
Wideband: >/= 32 UI, 10 Hz to 40 kHz
Highband: >/= 32 UI, 8 kHz to 40 kHz
Jitter Masks: CCITT O.171, PUB 41451, PUB 62411-1983, PUB 62411-1985, PUB 43801
Pulse Masks: CB 119 (ANSI T1.102), ANSI T1.403-1989
Wander Measurement: +99999 UI, 1 UI resolution
Power Requirements: 115 VAC 10%, 50 to 60 Hz
* Jitter Alarm and Trigger: Front panel indicator provides fast indentification of jitter problems. Isolate multiplexer and channel bank clock recovery problems with jitter measurements across the full 10 Hz to 40 kHz range.
* In-Band/Out-of-Band ESF Loopback Codes: Emulate and loopback network devices which accept either in-band or ESF out-of-band (datalink) loopback codes with ESF framing.
* B8ZS Detection ALL ZEROS Stress Pattern: Front panel indicator provides fast identifications of B8ZS encoded data. The ALL ZERO stress pattern identifies circuits not configured for or incompatible with B8ZS encoded data.
* Automated Pattern Testing: Detect elusive bridge taps with the BRIDGTAP(tm) automated stress pattern sequence. Perform qualification tests with the user-configurable MULTIPLAT(tm) stress pattern sequence.
* Ease of Use: Auto configuration and results summary provide immediate indentification of framing, pattern, and error status without any required set-up. The vacuum fluorescent display is ideally suited for dimly lit testing environments.
